Bo Chen 32dd4d10d0 tests: Temporarily disable test_vfio_user ... This test is flaky (#3400) while we are experiencing a bug of using the latest SPDK/NVMe backend as VFIO user device (#3401). Let's disable this test before we fix the above two issues. Signed-off-by: Bo Chen <chen.bo@intel.com>		2021-12-02 12:43:11 +01:00
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integration.rs	tests: Temporarily disable test_vfio_user	2021-12-02 12:43:11 +01:00